Smart Integrated Electronic Systems

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Phase shifter Phase noise Three-dimensional displays Bioimpedance spectroscopy Convective accelerometer Indirect testing FDSOI technology Noise measurement Test cost reduction Time-domain analysis Circuit faults MEMS Accelerometer Temperature distribution CMOS Analytical models Calibration Data fusion Thermal sensor One bit acquisition OQPSK Switches Built-In-Self-Test RF test Capacitors Integrated circuit reliability Specifications 1-bit acquisition CMOS memory circuits Analog/RF integrated circuits COTS Side-channel analysis Design SEU RSA Alternate test Interconnect Three-dimensional integrated circuits Analog/IF signals Delays Computer architecture Circuit 3D integration Integrated circuit interconnections Carbon nanotube interconnects Noise Integrated circuits Automatic test pattern generation 3D Competencies Advanced PMA STT-MRAM Bioimpedance Integrated circuit modeling Copper Current mirror Integrated circuit testing Interconnects Brainstorming Current conveyor Secure IC Monitoring Integrated circuit noise Low-cost measurements Education Reliability Evaluation Carbon nanotubes Through-silicon vias Analog signals Digital ATE Circuits Transistors Electrothermal analysis Clocks Cu-CNT composites Defects BIST Test efficiency Sensors Analog and RF integrated circuits Microprocessors Accelerometers Alternate testing Biosensor ATE programming Low power Integrated circuit design SRAM Process variability Digital signal processing Power supplies Magnetic tunneling Carbon nanotube Logic gates Power demand Test Heating Correlation Bandwidth Critical path delay