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Frequency mapping in dynamic light emission with wavelet transform

Abstract : Dynamic photon emission microscopy is an e cient tool to analyse today's integrated circuit. Nevertheless, the reduction of transistor's dimensions leads to more complex acquisitions where many spots can be seen. A frequency characterization of the whole acquired area can help to have a better understanding of it. With that purpose in mind, a new methodology to draw frequency mapping of dynamic light emission acquisition is reported. It is fully automated and based on wavelet transform and autocorrelation function. Regarding the possible use in an industrial context, the suggested method can help to localize abnormal emission activity and it gives some perspectives on automatic databases comparison.
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Contributeur : Sabir Jacquir Connectez-vous pour contacter le contributeur
Soumis le : jeudi 17 octobre 2013 - 13:11:10
Dernière modification le : vendredi 5 août 2022 - 14:54:00


  • HAL Id : hal-00874178, version 1


Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak. Frequency mapping in dynamic light emission with wavelet transform. Microelectronics Reliability, Elsevier, 2013, 53 (9), pp.1387-1392. ⟨hal-00874178⟩



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