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Article Dans Une Revue Microelectronics Reliability Année : 2013

Frequency mapping in dynamic light emission with wavelet transform

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Résumé

Dynamic photon emission microscopy is an e cient tool to analyse today's integrated circuit. Nevertheless, the reduction of transistor's dimensions leads to more complex acquisitions where many spots can be seen. A frequency characterization of the whole acquired area can help to have a better understanding of it. With that purpose in mind, a new methodology to draw frequency mapping of dynamic light emission acquisition is reported. It is fully automated and based on wavelet transform and autocorrelation function. Regarding the possible use in an industrial context, the suggested method can help to localize abnormal emission activity and it gives some perspectives on automatic databases comparison.
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Dates et versions

hal-00874178 , version 1 (17-10-2013)

Identifiants

  • HAL Id : hal-00874178 , version 1

Citer

Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak. Frequency mapping in dynamic light emission with wavelet transform. Microelectronics Reliability, 2013, 53 (9), pp.1387-1392. ⟨hal-00874178⟩
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