Accéder directement au contenu Accéder directement à la navigation
Article dans une revue

Multiscale analyses and characterizations of surface topographies

Christopher Brown 1, * Hans Hansen 2 Xiang Jane Jiang 3 François Blateyron 4 Johan Berglund 5, 6 Nicola Senin 7, 8 Tomasz Bartkowiak 9 Barnali Dixon 10 Gaëtan Le Goïc 11 Yann Quinsat 12 W. James Stemp 13 Mary Kathryn Thompson 14, 15 Peter Ungar 16, 17 E. Hassan Zahouani 18
* Auteur correspondant
1 Worcester Polytechnic Institute
2 DTU - Technical University of Denmark [Lyngby]
3 University of Huddersfield
4 Digital Surf
5 Swerea IVF
6 Chalmers University of Technology [Göteborg]
7 UON - University of Nottingham, UK
8 UNIPG - Università degli Studi di Perugia
9 PUT - Poznan University of Technology
10 USF - University of South Florida [Tampa]
11 Le2i - Laboratoire d'Electronique, d'Informatique et d'Image [EA 7508]
12 LURPA - Laboratoire Universitaire de Recherche en Production Automatisée
13 Keene State College
14 General Electric
15 GE Aircraft Engines
16 Department of Anthropology [University of Arkansas]
17 University of Arkansas [Fayetteville]
18 LTDS - Laboratoire de Tribologie et Dynamique des Systèmes
Abstract : This work studies multiscale analyses and characterizations of surface topographies from the engineering and scientific literature with an emphasis on production engineering research and design. It highlights methods that provide strong correlations between topographies and performance or topographies and processes, and methods that can confidently discriminate topographies that were processed or that perform differently. These methods have commonalities in geometric characterizations at certain scales, which are observable with statistics and measurements. It also develops a semantic and theoretical framework and proposes a new system for organizing and designating multiscale analyses. Finally, future possibilities for multiscale analyses are discussed. (C) 2018 Published by Elsevier Ltd on behalf of CIRP.
Keywords : Engineering Surfaces Dimensional Metrology Quantitative-Analysis Computed-Tomography Wavelet Transform Rough Surfaces Fractal Analysis Surface Metrology Roughness Area Structure-Function Ubm Laser Profilometry Dental Microwear Texture
Type de document :
Article dans une revue
Liste complète des métadonnées
https://hal-univ-bourgogne.archives-ouvertes.fr/hal-01924141
Contributeur : Le2i - Université de Bourgogne Connectez-vous pour contacter le contributeur
Soumis le : jeudi 15 novembre 2018 - 16:55:03
Dernière modification le : mercredi 3 novembre 2021 - 08:56:34

Identifiants

Collections

UNIV-BOURGOGNE | CNRS | UNIV-BM | ENS-CACHAN | EC-LYON | LE2I | LTDS | UNIV-BM-THESE | ENTPE | UNIV-HESAM | UDL | ARTS-ET-METIERS-SCIENCES-ET-TECHNOLOGIES | ENS-PARIS-SACLAY | GS-ENGINEERING

Citation

Christopher Brown, Hans Hansen, Xiang Jane Jiang, François Blateyron, Johan Berglund, et al.. Multiscale analyses and characterizations of surface topographies. CIRP Annals - Manufacturing Technology, Elsevier, 2018, 67 (2), pp.839 - 862. ⟨10.1016/j.cirp.2018.06.001⟩. ⟨hal-01924141⟩

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Les métriques sont temporairement indisponibles