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Communication dans un congrès
Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory: Automatic defect localization in VLSI circuits
Abstract : Defect localization in Very Large Integration Cir-
cuits (VLSI) requires to use multi-sensor information such as
electrical waveforms, emission microscopy images and frequency
mapping in order to detect, localize and identify the failure. Each
sensor provides a specific kind of feature modeling the evidence.
Thus, the defect localization in VLSI can be summarized as
a problem of data fusion with heterogeneous and imprecise
information. This study illustrates how to reproduce the human
decision for modeling and fusing the different multi-sensor
features by using the Demspter-Shafer theory. We propose not
only an automatic decision rule for mass functions computing
but also confidence intervals to quantify the final decision and to
bring a decision help for the analysts expertise. Finally, a case
of study is reported to attest the expert decision reproducibility
https://hal-univ-bourgogne.archives-ouvertes.fr/hal-01564417
Contributeur : Le2i - Université de Bourgogne Connectez-vous pour contacter le contributeur
Soumis le : mardi 18 juillet 2017 - 16:55:07
Dernière modification le : mercredi 3 novembre 2021 - 05:33:11
Contributeur : Le2i - Université de Bourgogne Connectez-vous pour contacter le contributeur
Soumis le : mardi 18 juillet 2017 - 16:55:07
Dernière modification le : mercredi 3 novembre 2021 - 05:33:11